The FEI Quanta line includes six variable-pressure and environmental scanning electron microscopes (ESEM™). All of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.
Quanta SEM for Materials Science
A proven, advanced, flexible platform for a wide range of materials characterization
Quanta is geared toward increasing publishable results from your lab. Quanta standard Environmental SEM (ESEM) capability delivers the extra power to handle the samples and applications you thought were impossible in electron microscopy, while aiding in prediction of material performance over time. Quanta's ESEM provides for in situ, dynamic experiments that offer many possibilities for materials research:
· Image hydrated samples.
· Crystallization or phase transformation during humidity or thermal cycling.
· Particles in suspensions or self-assembly processes.
· Corrosion in metals.
· Tensile testing, with heating or cooling if desired.
Versatility that facilitates dynamic in situ experiments
Quanta's versatility makes it well-suited to materials science. It is equally adept at performing conventional high-resolution SEM imaging/analysis and dynamic in situ experiments. Quanta allows you to study the widest range of samples in their natural state for the most accurate information about structure and composition:
· oxidation/corrosion samples
· ceramics, composites, plastics
· films and coatings
· soft materials: polymers, pharmaceuticals, gels
· particles, porous materials, fibers
A family of versatile, high-performance instruments
The Quanta family includes:
· Quanta 250 and Quanta 250 FEG
· Quanta 450 and Quanta 450 FEG
· Quanta 650 and Quanta 650 FEG
Quanta scanning electron microscopes feature three modes (high vacuum, low vacuum, and ESEM) to accommodate the widest range of samples of any SEM system. All Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy, and electron backscatter diffraction. In addition, the field emission gun (FEG) systems contain a S/TEM detector for bright-field and dark-field sample imaging. Another variable that changes amongst the SEM systems is the size of the motorized stage (50mm for the Quanta 250, 100mm for the Quanta 450, and 150mm for the Quanta 650) and the motorized z-range (25mm, 60mm, and 65mm, respectively). The Quanta 650 and 650 FEG are each designed with a roomy chamber, enabling the analysis and navigation of large specimens.